发明名称 METHOD FOR WASHING SEMICONDUCTOR MANUFACTURING APPARATUS COMPONENT, APPARATUS FOR WASHING SEMICONDUCTOR MANUFACTURING APPARATUS COMPONENT, AND VAPOR PHASE GROWTH APPARATUS
摘要 A semiconductor manufacturing apparatus component (101), to which a nitride semiconductor expressed by a general formula of AlxInyGa1-x-yN (provided that, x and y satisfy relationships of 0≰x<1, 0≰y<1, and 0≰x+y<1) adheres, is disposed inside a washing apparatus (100) provided with a gas introducing pipe (104) and a gas discharging pipe (105). After the inside of the apparatus is set to a decompressed state, a halogen-containing gas is introduced from the gas introducing pipe (104) to set a pressure inside the apparatus to be equal to or more than 10 kPa and equal to or less than 90 kPa. Then, the halogen-containing gas is retained inside the apparatus to remove the nitride semiconductor adhered to the semiconductor manufacturing apparatus component (101).
申请公布号 US2014144381(A1) 申请公布日期 2014.05.29
申请号 US201214116037 申请日期 2012.03.15
申请人 MIZUTA MASASHI;YAGUCHI YUICHI;NISHIKORI YUTAKA;FURUKAWA CO., LTD. 发明人 MIZUTA MASASHI;YAGUCHI YUICHI;NISHIKORI YUTAKA
分类号 H01L21/02;H01L21/67 主分类号 H01L21/02
代理机构 代理人
主权项
地址