发明名称 ACTIVE MATRIX DISPLAY DEVICE
摘要 <p>To restrain decrease of display quality because of increases in flicker level and decrease of uniformity in screen luminance caused by increases in the overcharging effect when an amorphous metal oxide semiconductor or an organic semiconductor that has an field-effect mobility greater than amorphous silicon is used for pixel TFTs in a liquid crystal display device or organic EL display device. A new relational formula is derived for punch-through voltage in gray scale display, where the visibility of flicker, screen burn-in, and the like is high, and in-plane differential in counter electrode potential, which are an index of the overcharging effect. A design is made so as to satisfy conditions for decreasing the in-plane differential in counter electrode potential that have been newly derived on the basis of this formula to an allowable limit value or less.</p>
申请公布号 KR20140064730(A) 申请公布日期 2014.05.28
申请号 KR20137030822 申请日期 2012.05.30
申请人 KAWANO HIDEO 发明人 KAWANO HIDEO
分类号 G09G3/36;G02F1/1368;G09G3/20 主分类号 G09G3/36
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