发明名称 Methods and layers for metallization
摘要 One aspect of the present invention is a method of making an electronic device. According to one embodiment, the method comprises depositing a cap layer containing at least one dopant onto a gapfill metal and annealing so that the at least one dopant migrates to grain boundaries and/or interfaces of the gapfill metal. Another aspect of the present invention is an electronic device.
申请公布号 US8736055(B2) 申请公布日期 2014.05.27
申请号 US201213409547 申请日期 2012.03.01
申请人 KOLICS ARTUR;PRAVEEN NALLA;LAM RESEARCH CORPORATION 发明人 KOLICS ARTUR;PRAVEEN NALLA
分类号 H01L23/48 主分类号 H01L23/48
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