发明名称 Integrated circuit resistor fabrication with dummy gate removal
摘要 Methods of fabricating a semiconductor device including a metal gate transistor and a resistor are provided. A method includes providing a substrate including a transistor device region and an isolation region, forming a dummy gate over the transistor device region and a resistor over the isolation region, and implanting the resistor with a dopant. The method further includes wet etching the dummy gate to remove the dummy gate, and then forming a metal gate over the transistor device region to replace the dummy gate.
申请公布号 US8735258(B2) 申请公布日期 2014.05.27
申请号 US201213343903 申请日期 2012.01.05
申请人 KO CHUN-HUNG;CHEN JYH-HUEI;WANG SHYH-WEI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 KO CHUN-HUNG;CHEN JYH-HUEI;WANG SHYH-WEI
分类号 H01L21/02;H01L21/20 主分类号 H01L21/02
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