发明名称 Delamination resistant device package having raised bond surface and mold locking aperture
摘要 A semiconductor package configured to attain a thin profile and low moisture sensitivity. Packages of this invention can include a semiconductor die mounted on a die attachment site of a leadframe and further connected with a plurality of elongate I/O leads arranged about the die attach pad and extending in said first direction. The leadframe having an“up-set”bonding pad arranged with a bonding support for supporting a plurality of wire bonds and a large mold flow aperture in the up-set bonding pad. The package encapsulated in a mold material that surrounds the bonding support and flows through the large mold flow aperture to establish well supported wire bonds such that the package has low moisture sensitivity.
申请公布号 US8736042(B2) 申请公布日期 2014.05.27
申请号 US201113324749 申请日期 2011.12.13
申请人 LI FELIX C.;LEE YEE KIM;LIM PENG SOON;YII TERH KUEN;LEE LEE HAN MENG@EUGENE;NATIONAL SEMICONDUCTOR CORPORATION 发明人 LI FELIX C.;LEE YEE KIM;LIM PENG SOON;YII TERH KUEN;LEE LEE HAN MENG@EUGENE
分类号 H01L23/48;H01L23/495;H01L23/52 主分类号 H01L23/48
代理机构 代理人
主权项
地址