发明名称 Integrated circuit transistors with multipart gate conductors
摘要 Metal-oxide-semiconductor transistors are provided. A metal-oxide-semiconductor transistor may be formed on a semiconductor substrate. Source and drain regions may be formed in the substrate. A gate insulator such as a high-K dielectric may be formed between the source and drain regions. A gate may be formed from multiple gate conductors. The gate conductors may be metals with different workfunctions. A first of the gate conductors may form a pair of edge gate conductors that are adjacent to dielectric spacers. An opening between the edge gate conductors may be filled with the second gate conductor to form a center gate conductor. A self-aligned gate formation process may be used in fabricating the metal-oxide-semiconductor transistor.
申请公布号 US8735983(B2) 申请公布日期 2014.05.27
申请号 US20080324791 申请日期 2008.11.26
申请人 LIU JUN;RATNAKUMAR ALBERT;XIANG QI;TUNG JEFFREY XIAOQI;ALTERA CORPORATION 发明人 LIU JUN;RATNAKUMAR ALBERT;XIANG QI;TUNG JEFFREY XIAOQI
分类号 H01L21/02;H01L21/28;H01L21/336;H01L21/8238;H01L29/49;H01L29/66 主分类号 H01L21/02
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