发明名称 Air-dielectric for subtractive etch line and via metallization
摘要 A method and structure is disclosed whereby multiple interconnect layers having effective air gaps positioned in regions most susceptible to capacitive coupling can be formed. The method includes providing a layer of conductive features, the layer including at least two line members disposed on a substrate and spaced from one another by less than or equal to an effective distance, and at least one such line member also having a via member extending away from the substrate, depositing a poorly conformal dielectric coating to form an air gap between such line members, and exposing a top end of the via.
申请公布号 US8735279(B2) 申请公布日期 2014.05.27
申请号 US201113013108 申请日期 2011.01.25
申请人 HORAK DAVID V;HUANG ELBERT;KOBURGER CHARLES W;PONOTH SHOM;YANG CHIH-CHAO;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HORAK DAVID V;HUANG ELBERT;KOBURGER CHARLES W;PONOTH SHOM;YANG CHIH-CHAO
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
主权项
地址