| 摘要 |
Disclosed is a substrate array testing device for an OLED panel comprising; a substrate transfer unit which arranges terminals of a substrate on a testing position in order while progressing the substrate for the OLED panel; a testing unit having probe pins which performs a contact and separation operations with a terminal pads on the substrate arranged on the testing position; a photographing unit which takes a picture of a contact state while the probe pins of the testing unit are in contact with the terminal pad on the substrate; and an image processing unit which determines an error of the contact state between the terminal pads and the probe pins by processing image data recorded by the photographing unit. The substrate transfer unit comprises a transfer unit which moves a transfer table in which the substrate is put, and the substrate on the transfer table. A checking window which sees the substrate from the lower side to the upper side is formed on a part of the transfer table to visually check the contact state between the terminal pads and the probe pins. An imaging camera is installed on the lower side of the checking window. According to the present invention, a pixel defect test of the substrate for the PLED panel can reduce pixel defect determination due to a contact error in a testing step by checking that a functional effort of a specific pixel is by a circuit manufacturing problem or a contact problem between the probe pin and the terminal pad of the substrate and can low a defect rate of the OLED panel manufacturing. |
