发明名称 ETCHING METHOD USING BLOCK-COPOLYMERS
摘要 <p>A lithography method includes a step (12) of obtaining a self-organizing block-copolymer layer (21) on a neuter layer (22″) (The neuter layer (22″) is placed on a substrate (23) and the self-organizing block-copolymer layer (21) includes two or more polymer components (24,25) having different etching resistance and a copolymer pattern structure formed by the micro-phase separation of the polymer components (24,25)), a step (14) of leaving the second polymer component (24) by selectively etching a first polymer of the self-organizing block-copolymer layer (21), and a step of applying a plasma etching (16) to the neuter layer (22″) by using the second polymer component (24) as a mask. (The plasma etching (16) includes inactive gas and H2).</p>
申请公布号 KR20140062412(A) 申请公布日期 2014.05.23
申请号 KR20130137046 申请日期 2013.11.12
申请人 IMEC;TOKYO ELECTRON LIMITED 发明人 CHAN BOON TEIK;TAHARA SHIGERU
分类号 H01L21/3065;H01L21/027 主分类号 H01L21/3065
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