发明名称 |
METHOD FOR CLEANING SEMICONDUCTOR SUBSTRATE AND METHOD FOR PRODUCING SEMICONDUCTOR SUBSTRATE |
摘要 |
<p>This method for cleaning a semiconductor substrate comprises: a first cleaning operation wherein a polished semiconductor substrate is cleaned using the cleaning agent (A) described below or the cleaning agent (B) described below; and a second cleaning operation wherein the semiconductor substrate is cleaned using the cleaning agent (C) described below after the first cleaning operation. Cleaning agent (A): a liquid cleaning agent that contains a hydrocarbon compound, a glycol ether and a surfactant Cleaning agent (B): a liquid cleaning agent that contains a hydroxide of an alkali metal, one or more substances that are selected from among hydroxycarboxylic acids and salts thereof, and one or more substances that are selected from among 1-hydroxyethane-1,1-diphosphonic acid and salts thereof Cleaning agent (C): a liquid cleaning agent that contains sulfuric acid and hydrogen peroxide and has a sulfuric acid concentration of 50% by mass or more</p> |
申请公布号 |
WO2014077370(A1) |
申请公布日期 |
2014.05.22 |
申请号 |
WO2013JP80939 |
申请日期 |
2013.11.15 |
申请人 |
LION CORPORATION;SAITO OPTICAL SCIENCE MANUFACTURING LTD. |
发明人 |
TAMURA KEI;ARAI MASAHIRO;FUJITA YUTA;TSUCHIDA MASUHIRO;SAITO NOBUEI |
分类号 |
H01L21/304;C11D3/18;C11D3/20;C11D7/06;C11D7/08;C11D7/18;C11D7/26;C11D7/36;C11D17/08 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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