发明名称 Polishing System with In-Sequence Sensor
摘要 A polishing apparatus includes a plurality of stations supported on a platform, the plurality of stations including at least two polishing stations and a transfer station, each polishing station including a platen to support a polishing pad, a plurality of carrier heads suspended from and movable along a track such that each polishing station is selectively positionable at the stations, and a controller configured to control motion of the carrier heads along the track such that during polishing at each polishing station only a single carrier head is positioned in the polishing station.
申请公布号 US2014141696(A1) 申请公布日期 2014.05.22
申请号 US201313791733 申请日期 2013.03.08
申请人 APPLIED MATERIALS, INC. 发明人 DAVID JEFFREY DRUE;SWEDEK BOGUSLAW A.;BENNETT DOYLE E.;OSTERHELD THOMAS H.;CHERIAN BENJAMIN;BENVEGNU DOMINIC J.;LEE HARRY Q.;D AMBRA ALLEN L.;RANGARAJAN JAGAN
分类号 B24B37/013 主分类号 B24B37/013
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