发明名称 Embedded JFETs for High Voltage Applications
摘要 A device includes a buried well region and a first HVW region of the first conductivity, and an insulation region over the first HVW region. A drain region of the first conductivity type is disposed on a first side of the insulation region and in a top surface region of the first HVW region. A first well region and a second well region of a second conductivity type opposite the first conductivity type are on the second side of the insulation region. A second HVW region of the first conductivity type is disposed between the first and the second well regions, wherein the second HVW region is connected to the buried well region. A source region of the first conductivity type is in a top surface region of the second HVW region, wherein the source region, the drain region, and the buried well region form a JFET.
申请公布号 US2014139282(A1) 申请公布日期 2014.05.22
申请号 US201414166475 申请日期 2014.01.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YEH JEN-HAO;CHENG CHIH-CHANG;SU RU-YI;HUO KER HSIAO;CHEN PO-CHIH;YANG FU-CHIH;TSAI CHUN-LIN
分类号 H03K17/22;H01L29/66;H01L29/808 主分类号 H03K17/22
代理机构 代理人
主权项
地址