发明名称 PROCESS MONITORING DIAGNOSTIC DEVICE AND PROCESS MONITORING DIAGNOSTIC PROGRAM
摘要 PROBLEM TO BE SOLVED: To give a plant administrator or operator a guide to a determination on what action should be taken in a case of abnormality.SOLUTION: A process monitoring diagnostic device includes a classification part 31, a model construction part 32 having an identification part and an abnormality detection data definition part, and a monitoring diagnostic part 33 having an extraction part and an abnormality level determination part. The classification part classifies process data and time-series data based upon property information. The identification part generates daily pattern data and non-daily pattern data from the classified time-series data. The abnormality detection data definition part generates an abnormality diagnostic model based upon the non-daily pattern data. The extraction part extracts the degree of deviation of the classified process data from the daily pattern data. The abnormality level determination part applies the degree of deviation to the abnormality diagnostic model, calculates abnormality detection data and a threshold, and determines an abnormality level based upon whether the abnormality detection data exceeds the threshold.
申请公布号 JP2014096050(A) 申请公布日期 2014.05.22
申请号 JP20120247560 申请日期 2012.11.09
申请人 TOSHIBA CORP 发明人 YAMANAKA OSAMU;HIRAOKA YUKIO;YOSHIZAWA NAOTO;SUGINO TOSHIHARU
分类号 G05B23/02 主分类号 G05B23/02
代理机构 代理人
主权项
地址