| 摘要 |
A resistance extracting apparatus, a resistance extracting method, and a computer-readable recording medium are provided. A resistance extracting apparatus includes an interface unit which receives parameter values of a semiconductor device, which are measured in a turn-on state and a turn-off state of the semiconductor device, a resistance value extracting unit which extracts resistance values which are independent from voltage applied to the semiconductor device using the parameter value measured in the turn-off state, and extracts resistance values which are dependent on the voltage using the parameter value measured in the turn-on state, and a control unit which controls the resistance value extracting unit to extract the independent resistance values and the dependent resistance values using the received parameter values. |
