发明名称 DEBUGGING IN A SEMICONDUCTOR DEVICE TEST ENVIRONMENT
摘要 A test system that enables real-time interactive debugging of a device under test (DUT) using native customer code. A translation module may format, in real time, debug commands, corresponding to a user input, into a format recognizable by instruments in a tester. The user input may be a test program or test instructions written in a high-level programming language. The translation module may translate the user's debug commands into lower-level test instrument commands, based on which the tester may apply control signals to a processor in the DUT to test subsystems of the DUT. A result of the test may be provided to the translation module, which may, in real time, format another debug command, or provide an indication of the result to the user. The translation module may thus enable a user to step-through and modify native customer code in an interactive manner to debug a DUT.
申请公布号 WO2014078196(A1) 申请公布日期 2014.05.22
申请号 WO2013US69215 申请日期 2013.11.08
申请人 TERADYNE, INC. 发明人 HUTNER, MARC, REUBEN;ROWE, JOHN, F.
分类号 G01R31/28;G06F9/455 主分类号 G01R31/28
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