发明名称 |
SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a sample analyzer and a sample analysis method in which the laser output is stable and continuous analysis of a sample can be conducted excellently.SOLUTION: A sample analyzer includes: a laser ablation section having a laser oscillation source with an oscillation output of 5 W or more, for irradiating the surface of a sample with a laser beam to make part of the sample into fine particles; and an element detection section to which the sample made into fine particles is introduced and a constituent element included in the sample is detected.</p> |
申请公布号 |
JP2014095727(A) |
申请公布日期 |
2014.05.22 |
申请号 |
JP20140023656 |
申请日期 |
2014.02.10 |
申请人 |
JX NIPPON MINING & METALS CORP |
发明人 |
KAMIMURA KENICHI |
分类号 |
G01N1/28;G01N21/73;G01N27/62 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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