发明名称 APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an appearance inspection device and an appearance inspection method, using an imaging device, capable of performing focus adjustment without variations and reducing adjustment time.SOLUTION: An appearance inspection device includes an imaging device that photographs an image of a photographing object and allows manual focus adjustment, a calculation device that calculates a focus value of the image photographed by the imaging device in real time, and a display device that displays the calculated focus value. An appearance inspection method includes manually adjusting the focus of the imaging device, while checking the focus value displayed on the display device, until the optimal focus value can be obtained, and performing appearance inspection by using an image of an inspection object photographed by the imaging device having the optimal focus value set thereto.
申请公布号 JP2014095593(A) 申请公布日期 2014.05.22
申请号 JP20120246409 申请日期 2012.11.08
申请人 SHIMADZU CORP 发明人 NAGAI MASAMICHI
分类号 G01N21/956;G01B11/30;G01N21/88 主分类号 G01N21/956
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