发明名称 AUTOMATIC TEST EQUIPMENT AND A TESTING METHOD THEREOF
摘要 An automatic test equipment and a testing method thereof are disclosed. The automatic test equipment includes a test apparatus, a first control device, a first assisting device, and a second control device. The test apparatus is applied for testing a first object, wherein the test apparatus has a first cover. The first control device has an activating device. The first assisting device is electrically connected to the first control device. The second control device is electrically connected to the first control device and the test apparatus. When the activating device is activated, the first control device controls the first assisting device to lower the first cover and then the first control device transmits a first control signal to the second control device for allowing the test apparatus to test the first object.
申请公布号 US2014139235(A1) 申请公布日期 2014.05.22
申请号 US201313897954 申请日期 2013.05.20
申请人 WISTRON CORPORATION 发明人 WANG CHUN-KAI;PENG HAI-JUN
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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