| 摘要 |
In an inspection device which carries out pattern matching on an image to be searched, a feature region extraction processing unit which extracts a feature value from a template image which is acquired for learning, a feature value extraction processing unit which extracts feature values from an image to be searched with is acquired for learning, a reciprocal feature value computation processing unit between the template image and the image to be searched from the feature value which is extracted from the template image and the feature value which is extracted from the image to be searched, a learning processing unit which computes an identification boundary which determines pass/fail of matching using a plurality of the reciprocal feature values, a processing unit which computes the plurality of reciprocal feature values from the image which is acquired from the inspection object, and matching is carried out on the inspection object template image and the image to be searched using the plurality of reciprocal feature values and the identification boundary. Thus, it is possible to provide an inspection device whereby, in template matching, an accurate matching location is outputted even with a large appearance deviation between the template and the image to be searched. |
