发明名称 TUNNELING FIELD EFFECT TRANSISTORS (TFETS) FOR CMOS ARCHITECTURES AND APPROACHES TO FABRICATING N-TYPE AND P-TYPE TFETS
摘要 Tunneling field effect transistors (TFETs) for CMOS architectures and approaches to fabricating N-type and P-type TFETs are described. For example, a tunneling field effect transistor (TFET) includes a homojunction active region disposed above a substrate. The homojunction active region includes a relaxed Ge or GeSn body having an undoped channel region therein. The homojunction active region also includes doped source and drain regions disposed in the relaxed Ge or GeSn body, on either side of the channel region. The TFET also includes a gate stack disposed on the channel region, between the source and drain regions. The gate stack includes a gate dielectric portion and gate electrode portion.
申请公布号 WO2014077903(A1) 申请公布日期 2014.05.22
申请号 WO2013US45504 申请日期 2013.06.12
申请人 INTEL CORPORATION 发明人 KOTLYAR, ROZA;CEA, STEPHEN M.;DEWEY, GILBERT;CHU-KUNG, BENJAMIN;AVCI, UYGAR E.;RIOS, RAFAEL;CHAUDHRY, ANURAG;LINTON, JR., THOMAS D.;YOUNG, IAN A.;KUHN, KELIN J.
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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