| 摘要 |
PROBLEM TO BE SOLVED: To provide a technology suitable for measuring electromagnetic field intensity to specify a distribution of an electromagnetic field.SOLUTION: A measurement system 1 includes a measurement device 10, a spectrum analyzer 20, and an information processing device 30. The measurement device 10 holds an electromagnetic field probe 11 for measuring electromagnetic field intensity and a camera 13 in an integrated manner. The camera 13 images a measurement object 100 whose electromagnetic field intensity is measured by the electromagnetic field probe 11. The spectrum analyzer 20 inputs electromagnetic field measurement data based on a signal from the electromagnetic field probe 11 to the information processing device 30. The information processing device 30 specifies a position of the electromagnetic field probe 11 on a wide-area captured image on the basis of image data captured by the camera 13 and wide-area captured image data of the measurement object 100 stored in advance, and stores a position coordinate thereof in association with the electromagnetic field measurement data. A screen displaying a superimposed image showing an electromagnetic field distribution on the wide-area captured image, is displayed on a display unit. |
