发明名称 PICKUP METHOD AND PICKUP DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To effectively use chips having a pattern different from chips that can be picked up for detecting chip deviations.SOLUTION: In the pickup method, a wafer 10 includes as chips 2 regular chips P that can be picked up and peculiar chips T having a pattern different from the regular chips P. Each of chip groups G1 to G15 includes regular chips P and one peculiar chip T. In each of the chip groups G1 to G15, a peculiar chip T is finally moved to a recognizable position and whether chips 2 are deviated or not is determined on the basis of a recognition result of the peculiar chip T.</p>
申请公布号 JP2014096525(A) 申请公布日期 2014.05.22
申请号 JP20120248412 申请日期 2012.11.12
申请人 CANON MACHINERY INC 发明人 NAKANO HARUYUKI
分类号 H01L21/52;H05K13/02;H05K13/08 主分类号 H01L21/52
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