发明名称 MATERIAL SAMPLING DEVICE WITH INTEGRATED MATERIAL ANALYZER ASSEMBLY
摘要 A material sampling and analyzing assembly comprises a material sampling device and a material analyzer assembly. The material sampling device is configured to extract a core sample of material from a supply of material. The material analyzer assembly is attached to a portion of the material sampling device. The material analyzer assembly comprises a first material analyzer configured to analyze a first testing sample, which comprises a first portion of the core sample. An alternate material sampling an analyzing assembly comprises a material sampling device comprising a discharge chute and a material analyzer assembly comprising a sample container and a material analyzer. The sample container is attached to the discharge chute. The sample container is configured to receive and temporarily retain a testing sample that is discharged from the discharge chute. The material analyzer is configured to analyze the testing sample while it is retained by the sample container.
申请公布号 WO2014078277(A1) 申请公布日期 2014.05.22
申请号 WO2013US69585 申请日期 2013.11.12
申请人 JOHNSON INDUSTRIES, INC. 发明人 JOHNSON, GEORGE, F.;GRENDER, ARNEMANN, R.
分类号 G01N35/00;G01N1/08 主分类号 G01N35/00
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