Method of testing a microelectronic circuit

摘要

A tester apparatus of the kind including a portable pack (108) comprising a portable supporting structure (10 and 110) for removably holding and testing a substrate (82) carrying a microelectronic circuit. A plurality of lands (193) forming a first interface and a plurality of contacts (188) connected to the first interface are arranged on the portable supporting structure. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.