TEST CONTACTOR OF PLATE TYPE INCLUDING SOCKET FOR TESTING SEMICONDUCTOR DEVICE AND UPPER FLANGER THEREOF

摘要

The present invention relates to a plate type inspection contactor of a semiconductor inspection socket. A plurality of plate type inspection contactors are formed in a semiconductor inspection socket to test electrical characteristics of a semiconductor device. The plate type inspection contactor electrically connects between a bump electrode of the semiconductor device and a pad of a test circuit board. For this, the plate type inspection contactor includes a pair of upper flangers, a pair of lower flangers and a contraction coil spring. A body unit of each of the upper flangers is extended from one side in the horizontal direction and a guide unit is formed by rotationally bending the extended part to face the inner surface of a housing hole. Therefore, the guide unit of the upper flanger of the plate type inspection contactor of the present invention is formed in a circular shape, the abrasion of the housing hole can be prevented by the circular guide unit, and the location accuracy and verticality can be improved.