发明名称 MOFSET mismatch characterization circuit
摘要 A semiconductor device comprising a first inverter circuit including a first PMOS transistor and a first NMOS transistor, a drain electrode of the first PMOS transistor coupled to a drain electrode of the first NMOS transistor, and a second inverter circuit including a second PMOS transistor and a second NMOS transistor, a drain electrode of the second PMOS transistor coupled to a drain electrode of the second NMOS transistor. A first output voltage pad coupled to gate electrodes of the first and second PMOS and NMOS transistors, and between the drain electrode of the first PMOS transistor and the drain electrode of the NMOS transistor to self-bias the first inverter circuit. A second output voltage pad coupled between the drain electrode of the second PMOS transistor and the drain electrode of the second NMOS transistor.
申请公布号 US8729954(B2) 申请公布日期 2014.05.20
申请号 US201113222323 申请日期 2011.08.31
申请人 MCANDREW COLIN C.;ZUNINO MICHAEL J.;FREESCALE SEMICONDUCTOR, INC. 发明人 MCANDREW COLIN C.;ZUNINO MICHAEL J.
分类号 H03K17/687 主分类号 H03K17/687
代理机构 代理人
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