发明名称 |
Method and system for wafer registration |
摘要 |
A method for wafer registration, the method may include: moving a wafer by an X-Y stage and acquiring wafer edge area images; and processing the wafer edge area images to locate an edge of the wafer. A system that includes a camera, an X-Y stage for moving a wafer; wherein the camera is arranged to acquire wafer edge area images; and a processor that is arranged to process the wafer edge area images to locate an edge of the wafer. |
申请公布号 |
US8731274(B2) |
申请公布日期 |
2014.05.20 |
申请号 |
US201113083561 |
申请日期 |
2011.04.10 |
申请人 |
LANGMANS ELDAD;KOREN SHIMON;CAMTEK LTD. |
发明人 |
LANGMANS ELDAD;KOREN SHIMON |
分类号 |
G06K9/00 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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