| 摘要 |
FIELD: measurement equipment.SUBSTANCE: invention relates to measurement equipment, in particular, to facilities for control of relief and surface properties of samples with the help of sclerometers, and may be used to assess variation of surface properties along the scanning path. For this purpose they perform scanning of the controlled surface more than once with different extent of probe approaching to the controlled surface with simultaneous production of data on spatial and power parameters of scanning, and sample parameters are defined using them, which characterise relief and/or properties of the sample surface, extent of probe action at the surface or surface layers of the sample, and also value of residual deformation is defined by difference of produced values of spatial and power parameters. At the same time the first scanning is carried out with a load at the probe, not causing plastic deformation of the surface, and they assess vertical movements of the probe in process of scanning, on the basis of which they build a profilogram of the controlled surface and determine parameters of its roughness, then the probe is returned into the initial position, the probe is inserted into the surface layer for the required depth, reflecting volume properties of the surface layer, due to application of the permanent normal load, and the second scanning is performed, and vertical movements of the probe are assessed, on the basis of which they build the curve of the support surface and assess its characteristics, and also define the distribution of hardness of the surface layer along the scanning path.EFFECT: expansion of functional capabilities of assessment of surface layer characteristics and production of more correct data reflecting volume properties of surface layers.2 dwg |
