发明名称 Resin pattern, method for producing the pattern, method for producing MEMS structure, method for manufacturing semiconductor device, and method for producing plated pattern
摘要 There is provided that a method for producing a resin pattern, and the method includes at least the steps (1) to (7) in this order; (1) a coating step of coating a photosensitive resin composition on a substrate; (2) a solvent removal step of removing the solvent from the applied photosensitive resin composition; (3) an exposure step of patternwise exposing the photosensitive resin composition from which the solvent has been removed, to an active radiation; (4) a development step of developing the exposed photosensitive resin composition using an aqueous developer liquid; (5) an overcoating step of providing an overcoat layer on the developed photosensitive resin composition; (6) a heat-treating step of heat-treating the photosensitive resin composition on which the overcoat layer has been provided; and (7) a removal step of removing the overcoat layer.
申请公布号 US8728716(B2) 申请公布日期 2014.05.20
申请号 US201213416870 申请日期 2012.03.09
申请人 ANDOU TAKESHI;FUJIMORI JUNICHI;YONEZAWA HIROYUKI;KAWABE YASUMASA;NAKAMURA HIDEYUKI;FUJIFILM CORPORATION 发明人 ANDOU TAKESHI;FUJIMORI JUNICHI;YONEZAWA HIROYUKI;KAWABE YASUMASA;NAKAMURA HIDEYUKI
分类号 G03F7/26 主分类号 G03F7/26
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