发明名称 Memory cells and methods of forming memory cells
摘要 Some embodiments include methods of forming memory cells. Programmable material may be formed directly adjacent another material. A dopant implant may be utilized to improve adherence of the programmable material to the other material by inducing bonding of the programmable material to the other material, and/or by scattering the programmable material and the other material across an interface between them. The memory cells may include first electrode material, first ovonic material, second electrode material, second ovonic material and third electrode material. The various electrode materials and ovonic materials may join to one another at boundary bands having ovonic materials embedded in electrode materials and vice versa; and having damage-producing implant species embedded therein. Some embodiments include ovonic material joining dielectric material along a boundary band, with the boundary band having ovonic material embedded in dielectric material and vice versa.
申请公布号 US8728839(B2) 申请公布日期 2014.05.20
申请号 US201313918637 申请日期 2013.06.14
申请人 MICRON TECHNOLOGY, INC. 发明人 BRESOLIN CAMILLO;SONCINI VALTER;ERBETTA DAVIDE
分类号 H01L21/00 主分类号 H01L21/00
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