发明名称 Semiconductor device dielectric interface layer
摘要 Embodiments related to methods for forming a film stack on a substrate are provided. One example method comprises exposing the substrate to an activated oxygen species and converting an exposed surface of the substrate into a continuous monolayer of a first dielectric material. The example method also includes forming a second dielectric material on the continuous monolayer of the first dielectric material without exposing the substrate to an air break.
申请公布号 US8728832(B2) 申请公布日期 2014.05.20
申请号 US201213465340 申请日期 2012.05.07
申请人 RAISANEN PETRI;GIVENS MICHAEL;VERGHESE MOHITH;ASM IP HOLDINGS B.V. 发明人 RAISANEN PETRI;GIVENS MICHAEL;VERGHESE MOHITH
分类号 H01L29/51;H01L21/314;H01L21/66 主分类号 H01L29/51
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