发明名称 Thin film silicon wafer and method for manufacturing the same
摘要 Provided are a thin film silicon wafer having high gettering capability, a manufacturing method therefor, a multi-layered silicon wafer formed by laminating the thin film silicon wafers, and a manufacturing method therefor. The thin film silicon wafer is manufactured by: forming one or more gettering layers immediately below a device layer which is formed in a vicinity of a front surface of a semiconductor silicon wafer; fabricating a device in the device layer of the semiconductor silicon wafer; and after the device has been fabricated, removing part of the semiconductor silicon wafer from a rear surface thereof to immediately below the gettering layers so as to leave at least one of the gettering layers in place. As a result, the thin film silicon wafer is allowed to have gettering capability even after having been reduced in thickness to be in a thin film form.
申请公布号 US8728870(B2) 申请公布日期 2014.05.20
申请号 US20080664232 申请日期 2008.06.04
申请人 TOBE SATOSHI;TAKENAKA TAKAO;SHIN-ETSU HANDOTAI CO., LTD. 发明人 TOBE SATOSHI;TAKENAKA TAKAO
分类号 H01L25/065 主分类号 H01L25/065
代理机构 代理人
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