发明名称 Probe apparatus and substrate transfer method
摘要 A probe apparatus includes a plurality of prober chamber arranged in a straight line; and a loader chamber having a substrate transfer mechanism that takes out a test target substrate from a container provided in an upper area of the prober chamber, lowers the test target substrate to a height corresponding to a loading/unloading port of the prober chamber, moves in front of a row of the prober chambers in parallel to the row of the prober chambers and transfers the test target substrate into the prober chamber. A reading mechanism for reading information recorded on the test target substrate held on the substrate transfer mechanism is installed at a horizontal moving mechanism that moves the substrate transfer mechanism in front of the row of the prober chambers in parallel to the row of the prober chambers.
申请公布号 US8726748(B2) 申请公布日期 2014.05.20
申请号 US20100939323 申请日期 2010.11.04
申请人 OBIKANE TADASHI;YANO KAZUYA;YAMADA HIROSHI;SUZUKI MASARU;YAMAMOTO YASUHITO;TOKYO ELECTRON LIMITED 发明人 OBIKANE TADASHI;YANO KAZUYA;YAMADA HIROSHI;SUZUKI MASARU;YAMAMOTO YASUHITO
分类号 G01D21/00 主分类号 G01D21/00
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