发明名称 EPITAXIAL WAFER
摘要 PROBLEM TO BE SOLVED: To provide a high-quality epitaxial wafer which is increased in doping uniformity, and improved in characteristics and yield.SOLUTION: An epitaxial wafer comprises: a substrate; and an epitaxial structure located on the substrate. The epitaxial structure is doped to have an n- or p-type conductivity, the doping uniformity of which is 10% or less.
申请公布号 JP2014093526(A) 申请公布日期 2014.05.19
申请号 JP20130225125 申请日期 2013.10.30
申请人 LG INNOTEK CO LTD 发明人 KANG SEOK MIN ; KIM JI HYE
分类号 H01L21/205;C23C16/42;C30B29/36 主分类号 H01L21/205
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