发明名称 |
FLASH MEMORY DETERIORATION INSPECTION DEVICE, DETERIORATION INSPECTION METHOD, AND DETERIORATION INSPECTION PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To efficiently patrol the entire flash memory without waste.SOLUTION: A flash memory deterioration inspection device comprises: an HW timer 22 that is timer means from which time information can be obtained; determination means 31 that obtains the time information from the HW timer 22 and determines a page for which error check is performed, by operation processing on the basis of the obtained time information; and processing means 32 that specifies the page which is determined by the determination means 31, reads stored data, and performs error check. |
申请公布号 |
JP2014092832(A) |
申请公布日期 |
2014.05.19 |
申请号 |
JP20120241496 |
申请日期 |
2012.11.01 |
申请人 |
TOSHIBA INFORMATION SYSTEMS (JAPAN) CORP |
发明人 |
HIRATA HIROTERU ; FUJIGAKI TAMIKI ; KAMA YASUHARU |
分类号 |
G06F12/16 |
主分类号 |
G06F12/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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