发明名称 FLASH MEMORY DETERIORATION INSPECTION DEVICE, DETERIORATION INSPECTION METHOD, AND DETERIORATION INSPECTION PROGRAM
摘要 PROBLEM TO BE SOLVED: To efficiently patrol the entire flash memory without waste.SOLUTION: A flash memory deterioration inspection device comprises: an HW timer 22 that is timer means from which time information can be obtained; determination means 31 that obtains the time information from the HW timer 22 and determines a page for which error check is performed, by operation processing on the basis of the obtained time information; and processing means 32 that specifies the page which is determined by the determination means 31, reads stored data, and performs error check.
申请公布号 JP2014092832(A) 申请公布日期 2014.05.19
申请号 JP20120241496 申请日期 2012.11.01
申请人 TOSHIBA INFORMATION SYSTEMS (JAPAN) CORP 发明人 HIRATA HIROTERU ; FUJIGAKI TAMIKI ; KAMA YASUHARU
分类号 G06F12/16 主分类号 G06F12/16
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