发明名称 Methods of Forming Patterns, and Methods of Forming Integrated Circuitry
摘要 Some embodiments include methods of forming a pattern. First lines are formed over a first material, and second lines are formed over the first lines. The first and second lines form a crosshatch pattern. The first openings are extended through the first material. Portions of the first lines that are not covered by the second lines are removed to pattern the first lines into segments. The second lines are removed to uncover the segments. Masking material is formed between the segments. The segments are removed to form second openings that extend through the masking material to the first material. The second openings are extended through the first material. The masking material is removed to leave a patterned mask comprising the first material having the first and second openings therein. In some embodiments, spacers may be formed along the first and second lines to narrow the openings in the crosshatch pattern.
申请公布号 US2014134841(A1) 申请公布日期 2014.05.15
申请号 US201414160659 申请日期 2014.01.22
申请人 MICRON TECHNOLOGY, INC. 发明人 SIPANI VISHAL
分类号 H01L21/768 主分类号 H01L21/768
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