| 摘要 |
[Problem] To provide a storage-device-state detection method for accurately detecting the state of health (SOH) and the state of charge (SOC) of a storage device. [Solution] A storage-device (1) state detection method for estimating the SOH or the SOC of a storage device (1) on the basis of the internal impedance of the storage device (1), the storage-device-state detection method being characterized by: measuring the internal resistance of the storage device (1), using a first frequency signal in which the internal impedance of the storage device (1) decreases as the temperature increases, and calculating an initial SOH or initial SOC of the storage device (1) on the basis of the measured internal resistance; and measuring the internal impedance of the storage device (1), using a second frequency signal in which the internal impedance of the storage device (1) increases as the temperature increases, and calculating the internal temperature of the storage device (1) on the basis of the measured internal impedance; and estimating the SOH or the SOC by correcting the initial SOH or the initial SOC using the calculated internal temperature. |
