发明名称 ENHANCED CAPTURE PADS FOR THROUGH SEMICONDUCTOR VIAS
摘要 <p>Method of forming a capture pad on a semiconductor substrate. The method includes providing a semiconductor substrate [300] having an active side and an inactive side and having a plurality of unfilled TSVs extending between the active side and the inactive side; filling the TSVs [304] with a metal such that the metal is recessed [316] with respect to at least one of the active side and the inactive side and does not entirely fill the TSVs; defining capture pad areas [314] on the at least one of the active side and inactive side adjacent to the recessed TSVs; filling the capture pad areas and recessed TSVs with the same metal to form a capture pad [308] in direct contact with each of the TSVs, each of the capture pads having an all metal portion that follows an outline of each of the TSVs. Also disclosed is a semiconductor substrate having a capture pad.</p>
申请公布号 WO2014074469(A1) 申请公布日期 2014.05.15
申请号 WO2013US68369 申请日期 2013.11.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FAROOQ, MUKTA, G.;GRIESEMER, JOHN, A.;LAFONTANT, GARY;PETRARC, KEVIN, S.;VOLANT, RICHARD, P.
分类号 H01L23/48 主分类号 H01L23/48
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