| 摘要 |
An integrated circuit implements a transistor aging effects sensor comprising first and second delay lines, each comprising a plurality of delay elements, and a register. The register comprises a plurality of flip-flops having data inputs driven by respective outputs of respective ones of the delay elements of the first delay line and clock inputs driven by one or more clock signals provided by at least one of the delay elements of the second delay line. Data outputs of the flip-flops of the register are indicative of one or more aging effects in transistors of the first and second delay lines. For example, the register may comprise a thermometer encoded register providing digital output signals used to determine aging effects in the transistors of the first and second delay lines. Embodiments can be implemented using differential delay lines or delay lines comprising respective inverter chains. |
