发明名称 ACTIVE DETECTION AND PROTECTION OF SENSITIVE CIRCUITS AGAINST TRANSIENT ELECTRICAL STRESS EVENTS
摘要 Apparatus and methods for active detection, timing, and protection related to transient electrical events are disclosed. A detection circuit can generate a first activation signal in response to a transient electrical stress event across a first node and a second node. A blocking circuit is configured to bias the base of a first driver bipolar transistor to slow down discharge of accumulated base charge of a first driver bipolar transistor, which permits the first driver bipolar transistor to remain activated for a longer period of time than had the base of the first driver bipolar transistor been biased to the same voltage as the emitter of the first bipolar transistor. Shut-off circuitry can be included in some embodiments to prevent a discharge circuit from activating during normal operating conditions.
申请公布号 US2014133055(A1) 申请公布日期 2014.05.15
申请号 US201213673896 申请日期 2012.11.09
申请人 ANALOG DEVICES, INC. 发明人 PARTHASARATHY SRIVATSAN;SALCEDO JAVIER ALEJANDRO
分类号 H02H9/04 主分类号 H02H9/04
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