发明名称 METAL GATE MOS TRANSISTOR WITH REDUCED GATE-TO-SOURCE AND GATE-TO-DRAIN OVERLAP CAPACITANCE
摘要 <p>The gate-to-source and gate-to-drain overlap capacitance of a MOS transistor (200) with a metal gate (230) and a high-k gate dielectric (226) are reduced by forming the high-k gate dielectric (226) along the inside of a sidewall structure (236) which has been formed to lie further away from the source (220) and the drain (222).</p>
申请公布号 WO2014074777(A1) 申请公布日期 2014.05.15
申请号 WO2013US69058 申请日期 2013.11.08
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED 发明人 MEHROTRA, MANOJ;NIIMI, HIROAKI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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