发明名称 |
METAL GATE MOS TRANSISTOR WITH REDUCED GATE-TO-SOURCE AND GATE-TO-DRAIN OVERLAP CAPACITANCE |
摘要 |
<p>The gate-to-source and gate-to-drain overlap capacitance of a MOS transistor (200) with a metal gate (230) and a high-k gate dielectric (226) are reduced by forming the high-k gate dielectric (226) along the inside of a sidewall structure (236) which has been formed to lie further away from the source (220) and the drain (222).</p> |
申请公布号 |
WO2014074777(A1) |
申请公布日期 |
2014.05.15 |
申请号 |
WO2013US69058 |
申请日期 |
2013.11.08 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED |
发明人 |
MEHROTRA, MANOJ;NIIMI, HIROAKI |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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