| 摘要 |
<p>The present invention relates to voltage measurement apparatus (470). The voltage measurement apparatus (470) comprises a potential attenuator configured to be electrically connected between first and second conductors (206,208), which are electrically coupled to a source (202). The potential attenuator comprises a first impedance (210) and a reference impedance arrangement (472) in series with each other. The reference impedance arrangement has an electrical characteristic which is changed in a known fashion. The voltage measurement apparatus (470) further comprises a processing arrangement (220,406) configured to acquire at least one signal from the reference impedance arrangement (472), the at least one signal reflecting change of the electrical characteristic in the known fashion; and to determine a voltage between the first and second conductors (206,208) in dependence on the fashion in which the electrical characteristic is changed being known and on the at least one signal. The voltage measurement apparatus is also configured such that an offset voltage is applied to the reference impedance arrangement (472).</p> |
