发明名称 |
SEMICONDUCTOR ELEMENT AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element which causes less deterioration in characteristics of a graphene and a manufacturing method of the semiconductor element.SOLUTION: A manufacturing method of a semiconductor element 15 comprises: a catalyst layer formation process of forming a catalyst layer 7 on a substrate 1; an exposure process of removing a part of the substrate 1 opposite to a part 7A of a rear face of the catalyst layer 7 to expose the part 7A of the rear face; a graphene formation process of forming a graphene 11 on the part 7A of the rear face; a transfer process of bringing the part 7A of the rear face to the substrate 1 side to transfer the graphene 11 onto the substrate 1; and a catalyst layer removal process of removing at least a part of the catalyst layer 7. |
申请公布号 |
JP2014090146(A) |
申请公布日期 |
2014.05.15 |
申请号 |
JP20120240664 |
申请日期 |
2012.10.31 |
申请人 |
DENSO CORP |
发明人 |
KOJIMA EIJI |
分类号 |
H01L29/786;C01B31/02;H01L21/336;H01L51/05;H01L51/30;H01L51/40 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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