MEASUREMENT DEVICE AND MEASUREMENT METHOD FOR MEASURING THE THICKNESS OF A PANEL-SHAPED OBJECT

摘要

The invention relates to a measurement device (100..103) for measuring the thickness (d) of a panel-shaped object (7), comprising a first measurement probe (21..23) for placing on a first surface (9) of the panel-shaped object (7), and a second to fourth measurement probe (31..53) for placing on a second surface (10) of the panel-shaped object (7) lying opposite said first surface (9). The measurement device (100..103) also comprises means for calculating the thickness (d) of the panel-shaped object (7) using the positions (81..84) at which said measurement probes (21..53) make contact with the panel-shaped object (7). The invention also relates to a measurement method for measuring the thickness (d) of a panel-shaped object (7).