| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of detecting a current leak location capable of further securely detecting a current leak location.SOLUTION: The method of detection a current leak location comprises: a step S1 of applying liquid crystal 40 to a semiconductor element 20; and a step of detecting as current leak location a phase transition region 40a of the liquid crystal 40 in which a phase transition is caused, while cooling the semiconductor element 20 with a cooling apparatus 34 so that the temperature of the semiconductor element 20 to which the liquid crystal 40 is applied is lower than a phase transition temperature of the liquid crystal 40, in a state where power is supplied to the semiconductor element 20. |
