发明名称 SPECTRAL REFLECTANCE MEASURING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a spectral reflectance measuring system capable of: improving accuracy in spectral reflectance measurement even in the case of having an error factor such as variations in spectral transmittance or positional deviation; and contributing to cost reduction due to the relaxing of manufacturing accuracy.SOLUTION: A plurality of kinds of light having known spectral energy distributions are made to be incident to store spectral sensitivity characteristic data for each area on a sensor in a memory 30. Based on the stored spectral sensitivity characteristic data, a spectral transmittance measurement of each pixel is calculated by a pixel spectral characteristic calculation unit 34. Based on the calculated spectral transmittance, a spectral reflectance of an object is calculated by an object spectral reflectance calculation unit 36.
申请公布号 JP2014089075(A) 申请公布日期 2014.05.15
申请号 JP20120238157 申请日期 2012.10.29
申请人 RICOH CO LTD 发明人 MARUYAMA TAKESHI;MASUDA KENSUKE;YAMANAKA YUJI
分类号 G01J3/02;G01J3/36;G01J3/51 主分类号 G01J3/02
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