发明名称 |
SPECTRAL REFLECTANCE MEASURING SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a spectral reflectance measuring system capable of: improving accuracy in spectral reflectance measurement even in the case of having an error factor such as variations in spectral transmittance or positional deviation; and contributing to cost reduction due to the relaxing of manufacturing accuracy.SOLUTION: A plurality of kinds of light having known spectral energy distributions are made to be incident to store spectral sensitivity characteristic data for each area on a sensor in a memory 30. Based on the stored spectral sensitivity characteristic data, a spectral transmittance measurement of each pixel is calculated by a pixel spectral characteristic calculation unit 34. Based on the calculated spectral transmittance, a spectral reflectance of an object is calculated by an object spectral reflectance calculation unit 36. |
申请公布号 |
JP2014089075(A) |
申请公布日期 |
2014.05.15 |
申请号 |
JP20120238157 |
申请日期 |
2012.10.29 |
申请人 |
RICOH CO LTD |
发明人 |
MARUYAMA TAKESHI;MASUDA KENSUKE;YAMANAKA YUJI |
分类号 |
G01J3/02;G01J3/36;G01J3/51 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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