| 摘要 |
A surface plasmon microscopy method comprises irradiating a sample 16 with a beam of electromagnetic radiation, wherein at least some of the radiation is incident on the sample at an angle or angles which results in the excitation of surface plasmons in the sample, and wherein the beam of radiation comprises a longitudinal axis 22 passing through a focus 24 of the beam. Both radiation P2 reradiated from the sample by one or more surface plasmons and radiation S1 reflected from a location on the sample which does not lie on the longitudinal axis passing through the focus are received at a detector 26. A path deflection insert 32 redirects the reflected radiation S1 onto path S1 to reach the detector. The received reradiated radiation P2 is then interfered with the received reflected radiation S1 to provide information about the sample. |
