| 摘要 |
An analog-to-digital (ADC) converter is disclosed that uses aspects of a single-slope ramp ADC, but with jump steps in the ramp voltage to increase speed. A look-ahead controller can cause a ramped voltage level to jump step and detect the number of analog input signals impacted due to the jump step. If the detected number is below a predetermined threshold, the ramp can be maintained from the new voltage level after the jump. If the detected number is above the predetermined threshold, the ramped voltage level can be returned to its original voltage level and trajectory. Thus, jump steps can be used to increase speed, but dynamic testing can be performed to ensure that error rates due to the jump step are minimized. |
