发明名称 Multi-step ADC with sub-ADC calibration
摘要 Various embodiments of the invention allow for error calibration in analog-to-digital converters (ADCs) having multiple cascaded ADC stages. The ADC stages exchange information that is utilized in the calibration process. Various embodiments allow for calibration of one stage by utilizing a feedback signal from at least one subsequent stage. Certain embodiments of the invention increase the speed of the calibration process by utilizing coarse and fine sub-ADCs.
申请公布号 US8723706(B1) 申请公布日期 2014.05.13
申请号 US201213597075 申请日期 2012.08.28
申请人 SHIN SOONKYUN;CHANG DONG-YOUNG;STRAAYER MATTHEW A. Z.;LEE HAE-SEUNG;MAXIM INTEGRATED PRODUCTS, INC. 发明人 SHIN SOONKYUN;CHANG DONG-YOUNG;STRAAYER MATTHEW A. Z.;LEE HAE-SEUNG
分类号 H03M1/06 主分类号 H03M1/06
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