发明名称 |
Multi-step ADC with sub-ADC calibration |
摘要 |
Various embodiments of the invention allow for error calibration in analog-to-digital converters (ADCs) having multiple cascaded ADC stages. The ADC stages exchange information that is utilized in the calibration process. Various embodiments allow for calibration of one stage by utilizing a feedback signal from at least one subsequent stage. Certain embodiments of the invention increase the speed of the calibration process by utilizing coarse and fine sub-ADCs. |
申请公布号 |
US8723706(B1) |
申请公布日期 |
2014.05.13 |
申请号 |
US201213597075 |
申请日期 |
2012.08.28 |
申请人 |
SHIN SOONKYUN;CHANG DONG-YOUNG;STRAAYER MATTHEW A. Z.;LEE HAE-SEUNG;MAXIM INTEGRATED PRODUCTS, INC. |
发明人 |
SHIN SOONKYUN;CHANG DONG-YOUNG;STRAAYER MATTHEW A. Z.;LEE HAE-SEUNG |
分类号 |
H03M1/06 |
主分类号 |
H03M1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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