发明名称 Integration of an amorphous silicon resistive switching device
摘要 An integrated circuit device. The integrated circuit device includes a semiconductor substrate having a surface region. A gate dielectric layer overlies the surface region of the substrate. The device includes a MOS device having a p+ active region. The p+ active region forms a first electrode for a resistive switching device. The resistive switching device includes an amorphous silicon switching material overlying the p+ active region and a metal electrode overlies the first metal conductor structure. The metal electrode includes a metal material, upon application of a positive bias to the metal electrode, forms a metal region in the amorphous silicon switching material. The MOS device provides for a select transistor for the integrated circuit device.
申请公布号 US8723154(B2) 申请公布日期 2014.05.13
申请号 US20100894057 申请日期 2010.09.29
申请人 JO SUNG HYUN;NAZARIAN HAGOP;CROSSBAR, INC. 发明人 JO SUNG HYUN;NAZARIAN HAGOP
分类号 H01L29/12;H01L21/8239;H01L27/105;H01L29/8605 主分类号 H01L29/12
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